Test Vision Symposium: Test's Role in Uniting the Industry (Day 2 of 2)

Thursday, July 14, 2022

9:00am – 4:30pm

Location: South Hall, Level 3, Room 302

Keynote Speaker(s)

Gaurav Verma, MS, BTech

Senior Director of Engineering
Qualcomm, California, United States
Abigail Malik

Sr. Sourcing Manager
Qualcomm, CA, United States

Session Moderator(s)

JN

Junko Nakaya

Global Marketing Communications
Advantest, CA, United States

Speaker(s)

Pouya Dastmalchi, PhD

Application Engineering Manager
FormFactor, CA, United States
Charles Watson, PhD

Member of Technical Staff
ISE Labs, California, United States
Don Thompson, MA

Director of Engineering
R&D Altanova, CA, United States
Mun Jun Leow

Product Manager
Teradyne, Singapore

Session Moderator(s)

RD

Richard Dumene

Test Engineer
Texas Instruments, TX, United States

Speaker(s)

Stacy Ajouri, MSEE

System Integration Engineer
Texas Instruments, TX, United States
Wes Smith, n/a

CEO
Galaxy Semiconductor, California, United States
Devaraj Karthikeyan

General Manager - Semiconductor Equipment
HCL Technologies, Tamil Nadu, India
Martin Stadler, n/a

Europe Field Application Manager
Teradyne, Bayern, Germany

Panel Session Moderator(s)

Jeorge Hurtarte, PhD, MBA

Sr. Director, Engineering
Lam Research

Panelist(s)

David Fried, PhD

Vice President ,Computational Products
Lam Research, California, United States
Gaurav Verma, MS, BTech

Senior Director of Engineering
Qualcomm, California, United States
Adam Smith

Director of Marketing
LitePoint, CA, United States
Eli Roth

Smart Manufacturing Product Manager
Teradyne, Colorado, United States
Ravi Mahajan, PhD

Intel Fellow, Director of Pathfinding for Assembly and Packaging Technologies for 7nm Silicon and Beyond , Technology and Manufacturing Group
Intel, Arizona, United States
Mark Gerber

Sr. Director of Engineering and Technical Marketing
ASE

Test Vision is today's premier workshop for semiconductor and system test experts, organized with a vision towards the future of test to discuss coming trends, innovations and requirements. It is a highly anticipated gathering of providers and users of test IP and equipment, all converging to hear and engage with leaders in the field. This symposium will examine where the IC Test industry is heading in the long-term and what test technologies and equipment will get us there. This year's theme is “Tests Role in Uniting the Industry”.

SESSIONS:
- High-speed
- Power
- Future of Test
- Test Challenges

Speakers to be Announced.

Presentations:

9:00am – 10:00am

Supply Chain Impact on Test and How to Partner for Better Success
Keynote Speaker: Gaurav Verma, MS, BTech – Qualcomm
Keynote Speaker: Abigail Malik – Qualcomm
10:00am

Session 3: Power Management and HW Design
Session Moderator: Junko Nakaya – Advantest
10:00am – 10:25am

Session 3.1: Probecard Challenges for Expanding Arrays of Fine Pad Pitch Device to Test Under Wide Temperature Range
Speaker: Pouya Dastmalchi, PhD – FormFactor
10:25am – 10:50am

Session 3.2: Latch-up Testing of High Power, Large Pin Count Devices on ATE
Speaker: Charles Watson, PhD – ISE Labs
10:50am – 11:15am

Session 3.3: Solving Socket Power Integrity; The Last Link in the Chain
Speaker: Don Thompson, MA – R&D Altanova
11:15am – 11:45am

Session 3.4: The Impact of User Experience (UX) on Post Silicon Validation
Speaker: Mun Jun Leow – Teradyne
1:00pm

Session 4: Data, Analytics, and Industry 4.0
Session Moderator: Richard L. Dumene – Texas Instruments
1:00pm – 1:25pm

Session 4.1: RITdb Tester Client: First Step to Smart Manufacturing at Test
Speaker: Stacy D. Ajouri, MSEE – Texas Instruments
1:25pm – 1:50pm

Session 4.2: On Omnivariate Approach to Reliability Improvement for Aerospace and Automotive Applications
Speaker: Wes Smith – Galaxy Semiconductor
1:50pm – 2:15pm

Session 4.3: Optimization of Backend Testing
Speaker: Devaraj Karthikeyan – HCL Technologies
2:15pm – 2:40pm

Session 4.4: Devops Best Practice Analysis for ATE Test Program Development
Speaker: Martin Stadler – Teradyne
3:00pm – 4:00pm

Panel Session: Uniting the Industry
Panel Session Moderator: Jeorge S. Hurtarte, PhD, MBA – Lam Research
Panelist: David M. Fried, PhD – Lam Research
Panelist: Gaurav Verma, MS, BTech – Qualcomm
Panelist: Adam Smith – LitePoint
Panelist: Eli Roth – Teradyne
Panelist: Ravi Mahajan, PhD – Intel
Panelist: Mark Gerber – ASE
4:00pm – 4:30pm

Closing Remarks, Day 2 Raffle & Symposium Raffle