Shengke Zhang

Efficient Power Conversion

Dr. Shengke Zhang is Vice President of Reliability and Failure Analysis at Efficient Power Conversion, where he leads the product reliability and failure analysis for GaN transistors and ICs. Prior to joining EPC, he worked on RF-MEMS devices in the mobile industry. He earned his Ph.D. degree in Materials Science and Engineering from Arizona State University investigating low-loss dielectrics for cellular and quantum computing applications. He received his B.S. degree from Huazhong University of Science and Technology. He was the author and co-author of more than 30 technical papers. He also serves as a committee member for JEDEC's JC-70 Wide Bandgap Power Electronic Conversion Semiconductors Committee.

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Presentation(s):

• IS03.3 - Using Test to Fail Methodology to Accurately Predict How Enhancement Mode GaN Devices Can Last More than 25 Years in Solar Applications

  Tuesday, March 21, 2023
  9:20 AM – 9:45 AM ET