VisIC Technologies Ltd., Israel
Kurt is the VP of Reliability and Qualification at VisIC Technologies. Kurt has 20+ years of experience in Gallium Nitride Reliability. He has worked on RF GaN devices at Raytheon, supporting reliability analysis of high power RF amplifiers for radar and other high frequency applications. More recently, Kurt was the Reliability Manager at Transphorm, working on high voltage GaN power devices. He was responsible for reliability testing, analysis and degradation models to support both physical understanding of factors contributing to the reliability of devices and customer requests for specialized testing and understanding. He contributed to the successful JEDEC and automotive qualification of Transphorm’s GaN products. He joined VisIC in July 2018 as the VP of Reliability and Qualification. He is tasked with continuing the work to understand the reliability of GaN power devices and oversee the qualification and reliability of VisIC devices
Kurt received his PhD in Electrical Engineering from UC San Diego in 2000. He is currently a member of the leadership team for the JEDEC JC70 efforts to develop standards for GaN and SiC testing, datasheets and reliability.
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Wednesday, March 22, 2023
4:20 PM – 4:45 PM ET