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Using a High Bandwidth Loss Probe to measure SiC and GAN FETs losses with a lower bandwidth Oscilloscope.
Tuesday, March 21, 2023
1:30 PM – 2:00 PM
ET
Location: W204ABC
Speaker(s)
Ken Henderson
Cleverscope, New Zealand
Describes a 2GHz Bandwidth Loss Probe for measuring GAN and SicFET losses using analog techniques to avoid the cost of very high bandwidth isolated probes and oscilloscope.
