Determination of the end-of-life (EOL) of power semiconductor modules is a fundamental problem in the investigation of the reliability of power electronics. In this digest, we experimentally found that the standard EOL criterion has poor generalizability under varied conditions. To address the issue, a new concept of the EOL criterion is proposed based on the gradient of the precursor. A more consistent lifetime consumption is obtained by this new criterion. Three experimental cases are provided to support the proof-of-concept.
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