Principal Engineer Tektronix India Pvt. Ltd., India
The preferred test method to measure the switching parameters of Wide Band-Gap is performed using the Double Pulse Test method. Each oscilloscope probe has its own propagation delay contributing to varying delay in simultaneous acquisition of current and voltage. It is difficult to remove skew at high dynamic range because of the limitations of present de-skew fixtures. This paper proposes an algorithm to model Vds using Id and to remove WBG waveform skew mathematically post waveform acquisition. This paper demonstrates the modelling of effective power loop inductance at WBG device transitions using drain to source voltage and drain current.
