A high-speed on-state voltage amplifier with clipping capability for the accurate dynamic characterization of fast-switching wide-bandgap power transistors is presented. The fast reaction time and the tunable gain makes it suitable for the characterization of a wide range of state-of-the-art power transistors. The novelty of the circuit lies in the best-in-class reaction time. The proposed probe also features a tunable voltage gain to improve the measurement range utilization of the oscilloscope. The circuit function has been validated with static transfer and dynamic double-pulse measurements.
