Electromagnetic interference (EMI) has become an increasingly important issue in high speed and high-power density power electronics applications. At low frequencies below 30 MHz, both conducted emission and radiated emission are regulated by international standards such as CISPR 25. However, EMI tests usually require specified experiment setups, and it is time consuming. It is desired for device manufacturer to develop the prediction techniques that can simplify the prediction process and provide accurate prediction results based on analysis and simulation basis as the virtual lab with multiple software tools.
