New Challenges and Solutions in Test and Characterization of WBG Power Devices

New Challenges and Solutions in Test and Characterization of WBG Power Devices

IS17.2 - Characterization of Threshold Voltage Instabilities in SiC Power MOSFETs

Wednesday, March 22, 2023

1:55 PM – 2:20 PM ET

Location: W204ABC

Industry Session Presenter(s)