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New Challenges and Solutions in Test and Characterization of WBG Power Devices
New Challenges and Solutions in Test and Characterization of WBG Power Devices
IS17.4 - Evaluating SiC Gate Bias Voltage Instability at Wafer Level
Wednesday, March 22, 2023
2:45 PM – 3:10 PM
ET
Location: W204ABC
Industry Session Presenter(s)
Vernon Rogers
Aehr
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