System/Application Engineer Advantest, CA, United States
This presentation will discuss the challenges of developing an Over the Air (OTA) ATE based production test cell for the testing of Antenna in Package (AiP) millimeter-wave modules. We will look at the drivers to move to AiP modules in applications such as 5G-NR devices, as well as examples of such modules.
Different options for OTA testing of AiPs for 5G-NR applications will be discussed including Far-field and Radiating near-field, with a comparison of their respective advantages and disadvantages. The challenges of socket design for over the air testing, which will cover the impact of the materials on the beam forming performance, the different options for socket implementation and also the type of interconnect (fixed or waveguide blindmating), and also the type of measurement antenna used: (dipole, patch, dual polarized, circular polarized, etc..) and a discussion of the differences and advantages of each type of measurement antenna.
Finally, the presentation will show different options for integrating an OTA solution into an existing ATE test cell to provide support for multi-site testing. Examples of the different techniques will be shown utilizing Advantest handlers.
