Digitization for Achieving the Next Node Challenges

Wednesday, July 13, 2022

2:00pm – 3:50pm

Location: Smart Manufacturing Pavilion, Meet the Experts Stage (South Hall Expo)

Session Moderator(s)

Ranjan Chatterjee

Vice President, Smart Factory Solutions
Cimetrix Connectivity Group / PDF Solutions, Illinois, United States

Speaker(s)

Justin Weinstein

Principal Engineer
GlobalFoundries, NY, United States
David Fried, PhD

Vice President ,Computational Products
Lam Research, California, United States
John Keever

CTO IoT Platforms
Telit, FL, United States
Wes Smith, n/a

CEO
Galaxy Semiconductor, California, United States
Miki Banatwala

Director Software Engineering
ONTO Innovation, Massachusetts, United States

Beyond the technologies, critical challenges for deeper adoption of Smart Manufacturing such as cybersecurity, cloud computing & security, sustainability and workforce development will require development and adoption of newer best practices from within and other adjacent industries.

Presentations:

2:00pm – 2:05pm

Welcome Remarks
Session Moderator: Ranjan Chatterjee – Cimetrix Connectivity Group / PDF Solutions
2:05pm – 2:25pm

Criticality of Subtool Data Standardization and Integration
Speaker: Justin Weinstein – GlobalFoundries
2:25pm – 2:45pm

Using Virtual Metrology, Virtual Process Models, Machine Learning and Equipment Intelligence to Address Next Node Technology Challenges
Speaker: David M. Fried, PhD – Lam Research
2:45pm – 3:05pm

Optimizing Factories with Artificial Intelligence and Connectivity Management in the Race to Productivity
Speaker: John Keever – Telit
3:05pm – 3:25pm

Identifying Predictive Anomalous Sensor Signals in the Noise of Semiconductor Wafer Manufacturing
Speaker: Wes Smith – Galaxy Semiconductor
3:25pm – 3:45pm

From Tactical to Transformational: Factors to Consider When Leveraging the Cloud
Speaker: Miki Banatwala – ONTO Innovation
3:45pm – 3:50pm

Closing Remarks
Session Moderator: Ranjan Chatterjee – Cimetrix Connectivity Group / PDF Solutions