Test Engineer
NXP Semiconductors
Noel Del Rio
Test Engineering EP NXP Semiconductor
Signal Integrity, and Power Integrity Design
BSECE (Bachelor of Science in Electronics and Communication Engineering)
Don Bosco Technical College , Philippines
Previous affiliation was as Asic Characterization Engineer for Teradyne , and Silicon Laboratories
Have been with NXP since 2010
Design and developed NXP High Speed Serdes Test Solution. That is for at speed testing at 25G/28G
Design and developed NXP Low Noise Floor test hardware for Multi-Site Testing of baseband devices (ADC, DAC, WIFI)
Use Ansys, Hyperlynx, Sigrity, Clarity, Mathlab for electro-magnetics design, transmission line physics application
on test hardware signal path design
Disclosure information not submitted.
Wednesday, July 13, 2022
1:30pm – 1:55pm