Test Vision Symposium - Test's Role in Uniting the Industry (Day 1 of 2)

Wednesday, July 13, 2022

9:00am – 5:00pm

Location: South Hall, Level 3, Room 302

Moderator(s)

John Shelley

Product Marketing Manager
Teradyne, MA, United States
Jeorge Hurtarte, PhD, MBA

Sr. Director, Engineering
Lam Research

Speaker(s)

Alan Liao

Director, Probe BU Product Marketing
FormFactor, CA, United States

Moderator(s)

Paul Berndt

Principal Test Engineer
Microsoft Corporation, WA, United States

Keynote Speaker(s)

Mark Roos, MSEE, MBA

CEO
Roos Instruments

Session Moderator(s)

Alan Liao

Director, Probe BU Product Marketing
FormFactor, CA, United States

Speaker(s)

Adrian Kwan

Senior Business Development Manager
Advantest, CA, United States
Ryan Garrison, PMP

Sr. Product Business Manager
FormFactor, OR, United States
Roger Nettles, Jr., MSEE

System/Application Engineer
Advantest, CA, United States
Brian Wadell, MEng EE

mm-Wave Systems Architect
Teradyne, Massachusetts, United States

Session Moderator(s)

Stuart Pearce

Sr Director Field Marketing
AEM, AZ, United States

Speaker(s)

Luca Fanelli, MA

SPEA America - President
SPEA S.p.A., Texas, United States
RD

Richard Dumene

Test Engineer
Texas Instruments, TX, United States
Brent Rousseau, EE

Factory Applications Lead
Teradyne

Session Moderator(s)

Stacy Ajouri, MSEE

System Integration Engineer
Texas Instruments, TX, United States

Poster Presenter(s)

Mieko Hirabayashi, PhD

Senior Microelectronics Engineer
Sandia
David Ducrocq

Application Technical Lead
Teradyne, Rhone-Alpes, France
Tom Tran

Product Manager
Teradyne
LG

Lauren Getz

Product Manager
Teradyne, MA, United States
Don Thompson, MA

Director of Engineering
R&D Altanova, CA, United States

Test Vision is today's premier workshop for semiconductor and system test experts, organized with a vision towards the future of test to discuss coming trends, innovations and requirements. It is a highly anticipated gathering of providers and users of test IP and equipment, all converging to hear and engage with leaders in the field. This symposium will examine where the IC Test industry is heading in the long-term and what test technologies and equipment will get us there. This year's theme is "Tests Role in Uniting the Industry".

SESSIONS:
- High-speed
- Power
- Future of Test
- Test Challenges

Presentations:

9:00am – 9:10am

Opening Remarks
Moderator: John Shelley – Teradyne
Moderator: Jeorge S. Hurtarte, PhD, MBA – Lam Research
9:10am – 9:20am

Program Review
Moderator: Richard L. Dumene – Texas Instruments
Moderator: Alan Liao – FormFactor
9:20am – 9:50am

2021 Best Paper Award and Presentation
Moderator: Paul Berndt – Microsoft Corporation
9:50am – 10:50am

Modular ATE, the solution for testing Heterogeneous Integrated SOCs
Keynote Speaker: Mark Roos, MSEE, MBA – Roos Instruments
10:50am

Session 1: High Speed and Mmwave
Session Moderator: Alan Liao – FormFactor
10:50am – 11:15am

Session 1.1: 802.11BE wifi-7 4096 QAM 320 Mhz ATE Test Methodology
Speaker: Adrian Kwan – Advantest
11:15am – 11:40am

Session 1.2: 5G Mmwave: Multi-site RF Probe Cards Enable Lower Cost-of-test in Mass Production
Speaker: Ryan Garrison, PMP – FormFactor
11:40am – 12:05pm

Session 1.3: 5G Millimeter Wave over the Air Production Testing on ATE
Speaker: Roger C. Nettles, Jr., MSEE – Advantest
12:05pm – 12:30pm

Session 1.4: Results of a Handler-based Solution for 60 GHz AiP DUT
Speaker: Brian C. Wadell, MEng EE – Teradyne
1:30pm

Session 2: The Future of Test
Session Moderator: Stuart Pearce – AEM
1:30pm – 1:55pm

Session 2.1 Analytical Techniques for ADCDAC Test Loadboard Design
Speaker: Noel del Rio, BSECE (Bachelor of Science in Electronics & Communication Engineering) – NXP Semiconductors
1:55pm – 2:20pm

Session 2.2: ATE Instrument Modeling Speeds up Time to Market and Load Board Design
Speaker: Luca Fanelli, MA – SPEA
2:20pm – 2:45pm

Session 2.3: Abstract Test and Specification Definition: Call for a Standard Test
Speaker: Richard L. Dumene – Texas Instruments
2:45pm – 3:10pm

Session 2.4: Battery Management Systems (BMS) Device Testing and Trends for Automotive
Speaker: Brent Rousseau, EE – Teradyne
3:10pm – 3:15pm

Closing Remarks & Day 1 Raffle
3:15pm

Poster Session
Session Moderator: Stacy D. Ajouri, MSEE – Texas Instruments
3:15pm – 5:00pm

Poster: Endpoint Detection for Through Silicon via Processing
Poster Presenter: Mieko Hirabayashi, PhD – Sandia
3:15pm – 5:00pm

Poster: Explosive Demand for Discrete Wide Bandgap Devices Driving Next Generation Wafer Sort Solutions
Poster Presenter: Tom Tran – Teradyne
3:15pm – 5:00pm

Poster: Increased Power in Ai—hyperscalers Drive Higher Current Power Management Solutions
Poster Presenter: Lauren Getz – Teradyne
3:15pm – 5:00pm

Poster: Minimizing Execution Risk in Test Solution Development Projects with a Technical Project Lead
Poster Presenter: David Ducrocq – Teradyne
3:15pm – 5:00pm

Poster: Optimizing Pcbs for 5G Load Boards
Poster Presenter: Don Thompson, MA – R&D Altanova