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Session: Test Vision Symposium - Test's Role in Uniting the Industry (Day 1 of 2)

Modular ATE, the solution for testing Heterogeneous Integrated SOCs

Wednesday, July 13, 2022

9:50am – 10:50am

Location: South Hall, Level 3, Room 302

Keynote Speaker(s)

Mark Roos, MSEE, MBA

CEO
Roos Instruments

Talks about the increase in test complexity needed for the next generation chips.
Includes RF subsystems, probe, final and SLT issues
Proposes tester HW and SW approach to address test cost and complexity.
More of an architectural bent.