72 - Machine Learning for Failure and Artifact Detection

Chair(s)

• 

  Hyoungsik Nam, PhD

  Professor
  Kyung Hee University
  Seoul, Republic of Korea

Co-Chair(s)

• 

  Robert Visser, PhD

  VP CTO Group
  Applied Materials
  Menlo Park, California

Presentations:

• 10:40 AM – 11:00 AM

  In-Line Mura Detection Using Convolutional Neural Network in Display Manufacturing
  

  Symposium Speaker: Satoru Tomita – Japan Display Inc.
• 11:00 AM – 11:20 AM

  A Proposal for Image Compression Algorithm For Display Test Images
  

  Symposium Speaker: Hao Tang, PhD – Jingce Electronics - USA
• 11:20 AM – 11:40 AM

  Deep Learning Based Visual Defect Detection in Noisy and Imbalanced Data
  

  Symposium Speaker: Qisen Cheng, PhD – Samsung Display America Lab
• 11:40 AM – 12:00 PM

  Synthetic Defect Generation for Display Front-of-Screen Quality Inspection: A Survey
  

  Symposium Speaker: Meng Cao, Ph.D – Apple, Inc.