Senior RD Manager Universal Display Corporation Ewing, New Jersey
In this paper we explore energy loss in the novel plasmonic PHOLED device architecture that enables next-generation OLED operation by harnessing energy previously believed to be trapped in the plasmon mode. We determine that the quality of Ag used in the plasmon out-coupling scheme can increase the device efficiency by greater than 30%. We identify the Ag adhesion layer as a way to tune the quality of Ag and discuss the effects on both plasmon in- and out-coupling efficiencies.
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